James Yip 編集者 at IgMin Research
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バイオグラフィー
Dr. James Yip is an internationally recognized pathologist with extensive expertise in neurological and hematological disorders. He obtained his Master’s degree focusing on transplant immunology at the University of Western Ontario, Canada. He completed his MD degree at Wayne State University, where he contributed extensively to neuroprotection and vascular stroke research at the Department of Neurosurgery. He further completed a fellowship at Weill Cornell Medicine with subspecialization in hematologic
disorders.
研究の興味
T cells, NK cells, CNS neoplasms, hematolymphoid neoplasms
Editor
仕事内容
Doctor
Weill Cornell Medicine
Department of Pathology and Laboratory Medicine
USA
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研究論文
- Modeling of Cr3+ doped Cassiterite (SnO2) Single Crystals
- Efficacy of Alternative Insecticides against Dusky Cotton Bug (Oxycarenus laetus) to Improve Yield Losses in Cotton Crops through Residue-based Bioassay
- LC-MS and HPLC-UV for Detecting Uremic Toxins: Two Validated Methods with Simultaneous Sensitivity and Specificity Evaluation
- On how Doping with Atoms of Gadolinium and Scandium affects the Surface Structure of Silicon
- Influence of Polycarboxylate Superplasticizer on the Calorimetric and Physicomechanical Properties of Mortar
- Enhancing Material Property Predictions through Optimized KNN Imputation and Deep Neural Network Modeling
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